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Staying ahead of the competition in the solar industry can be just a few tenths of a percentage increase in efficiency. Time temperature profiling at the wafer can significantly increase your understanding of critical process parameters that directly impact cell efficiency:
ECD’s V-M.O.L.E.® Solar Profiling System is designed to provide assurance that these key process parameters are met quicker and easier than any other profiler on the market.
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ECD's V-M.O.L.E.® Solar Profiling System for solar cell metallization
The MEGAM.O.L.E.® delivers your specifications in a sleek 7.2mm thin package with patented productivity enhancing features that will give you the edge in R&D decision making to WOW Management, Customers and your OEM-EMS QA linkage.
We would like to help you with your Solar process. Let's find a way to increase your process efficiency and save money.
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