ECD website uses cookies to ensure you get the best experience on our website.


ECD Thermosphere Collective IQ

The ECD Thermosphere Collective IQ is a collaboration of shared intelligence with Thermal Measurment as the primary focus.

 
Return to previous page

WaveRIDER® SPC & OvenRIDER® SPC Process Capability

Posted on Jan 04, 2016

A process capability index is a standard measure of how a process compares with its specification limits-how a process is performing relative to how it is supposed to perform. As opposed to the control chart, which shows detailed information about how the data compares with control limits, a capability index is a summary of how the data compares with the specification limits.

Two common capability indicators are Cp and Cpk. These values are shown in the Statistics Box on each SPC Worksheet.

CPK Oven Table

For both of the index values, the data used to determine them is dictated by the subgroup size (N) chosen by the user. In the case where N=1, individual data is used-for N>1, average data is used (x bar).

The figures below give a graphical representation of the concept of Cp and Cpk. Notice that in each graph, the same upper and lower specification limits (USL, LSL) are used. The values of Cp and Cpk will differ according to the data that is compared with those specifications.

Depending on the particular process being monitored, the desired value for Cp and Cpk may differ. In general, however, a Cp and Cpk of 1.33 or above is desired. This assures that the process is not only capable of meeting the required specification limits, but also has a built-in margin for error that may be needed in special circumstances. In addition to targeting a certain minimum Cp and Cpk, it is also desirable to have these two values equal one another. This indicates that the process is well-centered between the specification limits.

CP CPK CP CPK

The equations used to calculate the index values are as follows:

CPK Equation

As can be interpreted from the above equations, Cp gives an indication of how narrow the data distribution is relative to the width of the specification limits. Essentially, it indicates how well the process would be able to stay within the specified limits if the data were perfectly centered between those limits.

Cpk compares the widest half of the data distribution to the appropriate specification limit. It indicates whether the process is capable of meeting the specification as indicated by the "worst half" of the measurements. Unlike Cp, the Cpk index measures process capability without assuming the data is well-centered.

© ECD, 1996 - 2017. All rights reserved.